K. Anno

发表

Study of solid surfaces using micro-electron-beams

S. Teruyama, S. Kono, N. Nakamura, 1993 .

Developments of a surface-analysis apparatus and techniques using micro-probe electron beams

S. Teruyama, S. Kono, N. Nakamura, 1992 .

Structure analysis of the single-domain Si(111)4 × 1-In surface by μ-probe Auger electron diffraction and μ-probe reflection high energy electron diffraction

S. Kono, N. Nakamura, K. Anno, 1991 .

VUV and Soft-X-Ray Photoemission Studies of Electronic and Atomic Structures of Metal-Overlayers on Silicon Surfaces

Shoji Suzuki, S. Kono, Y. Enta, 1990 .

Study of the surface electromigration of In on Si(111) surfaces by the use of micro-electron-beams

S. Kono, N. Nakamura, K. Anno, 1992 .

Reinvestigation of the Structure of Si(111) √3 × √3-Ag Surface

S. Kono, T. Abukawa, K. Anno, 1989 .

A new method of surface structure-analysis by medium energy electron diffraction: distinction between T4 and H3 models for the Si(111)√3 × √3 -In surface

S. Kono, N. Nakamura, K. Anno, 1992 .