M. L. Grassa

Role of defects in the thermal droop of InGaN-based light emitting diodes

Gaudenzio Meneghesso, Enrico Zanoni, Matteo Meneghini, 2016 .

ESD characterization of multi-chip RGB LEDs

Gaudenzio Meneghesso, Enrico Zanoni, Diego Barbisan, 2013, Microelectron. Reliab..

Degradation of InGaN-based LEDs related to charge diffusion and build-up

Gaudenzio Meneghesso, Enrico Zanoni, Matteo Meneghini, 2016, Microelectron. Reliab..

Ageing of InGaN-based LEDs: Effects on internal quantum efficiency and role of defects

Gaudenzio Meneghesso, Enrico Zanoni, Matteo Meneghini, 2015, Microelectron. Reliab..

Characterization of the deep levels responsible for non-radiative recombination in InGaN/GaN light-emitting diodes

Gaudenzio Meneghesso, Enrico Zanoni, Matteo Meneghini, 2014 .