Zhi-Min Ling

Application-specific test methods for programmable logic devices

Jae Cho, G. Shelly Davis, S. Clay Johnson, 2002 .

Lithography simulation of contamination-caused defects

Kevin D. Lucas, Andrzej J. Strojwas, Zhi-Min Ling, 1995, Advanced Lithography.

An effective method of characterization poly gate CD variation and its impact on product performance and yield

Feng Wang, Zhi-Min Ling, Xiao-Yu Li, 2003 .

Modeling of defect size distribution in yield forecasting

Zhi-Min Ling, YungTao Lin, Juan Rosal, 1995, Advanced Lithography.

The impact of reverse tone (n+ & p+ implant) mask and its mis-alignment on salicidation process integration

Zhi-Min Ling, T. Vo, Tho La, 2001, 2001 6th International Conference on Solid-State and Integrated Circuit Technology. Proceedings (Cat. No.01EX443).