Shigetoshi Sugawa

Examination of degradation mechanism due to negative bias temperature stress from a perspective of hole energy for accurate lifetime prediction

Rihito Kuroda, Akinobu Teramoto, Kazufumi Watanabe, 2007, Microelectron. Reliab..

[Paper] Preserved Color Pixel: high-resolution and high-colorfidelity image acquisition using single image sensor with sub-half-micron pixels

Rihito Kuroda, Shigetoshi Sugawa, Yuichiro Yamashita, 2020 .

A 100dB DR CMOS Image Sensor Using a Lateral Overflow Integration Capacitor

Shigetoshi Sugawa, Satoru Adachi, Nana Akahane, 2005 .