Kirby Kruckmeyer

ELDRS Characterization of Texas Instruments LM185, 1.2V Precision Reference: Retrograde Behavior Demonstrates Why Taking Interim Test Points Is Important

Kirby Kruckmeyer, Thang Trinh, 2014, 2014 IEEE Radiation Effects Data Workshop (REDW).

TID and SEL test results for texas instruments' LMX2492 14 GHz PLL

Simon Damphousse, Kirby Kruckmeyer, Thang Trinh, 2016, 2016 16th European Conference on Radiation and Its Effects on Components and Systems (RADECS).

SEE Testing of National Semiconductor's LM98640QML System on a Chip for Focal Plane Arrays and Other Imaging Systems

Kirby Kruckmeyer, Robert Eddy, Alex Szczapa, 2010, 2010 IEEE Radiation Effects Data Workshop.

ELDRS Characterization up to 300 Krad of Texas Instruments High Speed Amplifiers, LM7171 and LM6172

Kirby Kruckmeyer, Thang Trinh, 2015, 2015 IEEE Radiation Effects Data Workshop (REDW).

ELDRS Characterization to 300 krad of Texas Instruments High Speed Amplifier LMH6702

Kirby Kruckmeyer, Thang Trinh, 2016, 2016 IEEE Radiation Effects Data Workshop (REDW).

Single Event Transient (SET) Response of National Semiconductor's ELDRS-Free LM139 Quad Comparator

Sandeepan DasGupta, Kirby Kruckmeyer, Stephen P. Buchner, 2009, 2009 IEEE Radiation Effects Data Workshop.

Single Event Effects Characterization of Texas Instruments ADC12D1600CCMLS, 12 Bit, 3.2 GSPS Analog-to-Digital Converter with Static and Dynamic Inputs

Kirby Kruckmeyer, Thang Trinh, 2014, 2014 IEEE Radiation Effects Data Workshop (REDW).

Total Ionizing Dose Characterization of the Calibration Circuit of Texas Instruments' ADC12D1600CCMLS, 12b, 3.2 GSPS Analog-to-Digital Converter

Kirby Kruckmeyer, Thang Trinh, Linton Park, 2013, 2013 IEEE Radiation Effects Data Workshop (REDW).

Low dose rate test results of national semiconductor's ELDRS-free bipolar comparators LM111 and LM119

Kirby Kruckmeyer, Bill Brown, Larry McGee, 2009, 2009 European Conference on Radiation and Its Effects on Components and Systems.

Evaluation of an Accelerated ELDRS Test Using Molecular Hydrogen

Kirby Kruckmeyer, Ronald L Pease, Philippe C Adell, 2010, IEEE Transactions on Nuclear Science.

Single Event Effects Compendium of Candidate Spacecraft Electronics for NASA

Kenneth A. LaBel, Michael J. Campola, Martha V. O'Bryan, 2009, 2009 IEEE Radiation Effects Data Workshop.

Impact of reference voltage on the ELDRS characteristics of the LM4050 shunt voltage reference

Thang Trinh, Kirby Kruckmeyer, Andrew T. Kelly, 2011 .