Stephen P. Buchner

发表

2018 IEEE Nuclear and Space Radiation Effects Conference Awards Comments by the Chairman

Stephen P. Buchner, 2019 .

Single-Event Effects in a Millimeter-Wave Receiver Front-End Implemented in 90 nm, 300 GHz SiGe HBT Technology

John D. Cressler, Hanbin Ying, Jeffrey H. Warner, 2017, IEEE Transactions on Nuclear Science.

Compendium of Single Event Effects, Total Ionizing Dose, and Displacement Damage for Candidate Spacecraft Electronics for NASA

Martha V. O'Bryan, Edward P. Wilcox, Donna J. Cochran, 2014, 2014 IEEE Radiation Effects Data Workshop (REDW).

Design of Radiation-Hardened RF Low-Noise

John D. Cressler, Jeffrey H. Warner, Zachary E. Fleetwood, 2014 .

Best Practices for Using Electrostatic Discharge Protection Techniques for Single-Event Transient Mitigation

John D. Cressler, Jeffrey H. Warner, Ickhyun Song, 2019, IEEE Transactions on Nuclear Science.

Total Ionizing Dose and Displacement Damage Compendium of Candidate Spacecraft Electronics for NASA

Martin A. Carts, Michael J. Campola, Martha V. O'Bryan, 2010, 2010 IEEE Radiation Effects Data Workshop.

An Investigation of Single-Event Effect Modeling Techniques for a SiGe RF Low-Noise Amplifier

John D. Cressler, Jeffrey H. Warner, Adrian Ildefonso, 2016, IEEE Transactions on Nuclear Science.

Single Event Transient (SET) Response of National Semiconductor's ELDRS-Free LM139 Quad Comparator

Sandeepan DasGupta, Kirby Kruckmeyer, Stephen P. Buchner, 2009, 2009 IEEE Radiation Effects Data Workshop.

SEE and TID Results for Commercial Non-Optogalvanic Isolators for Space Application

Mark A. Jacobson, Patrick J. McMarr, Stephen P. Buchner, 2010, 2011 IEEE Radiation Effects Data Workshop.

On the Transient Response of a Complementary (npn $+$ pnp) SiGe HBT BiCMOS Technology

Mehmet Kaynak, John D. Cressler, Jeffrey H. Warner, 2014, IEEE Transactions on Nuclear Science.

An Investigation of Single Event Transient Response in 45-nm and 32-nm SOI RF-CMOS Devices and Circuits

John D. Cressler, Zachary E. Fleetwood, Nelson E. Lourenco, 2013, IEEE Transactions on Nuclear Science.

p-n-p-Based RF Switches for the Mitigation of Single-Event Transients in a Complementary SiGe BiCMOS Platform

Mehmet Kaynak, Ickhyun Song, Zachary E. Fleetwood, 2018, IEEE Transactions on Nuclear Science.

An Investigation of the Use of Inverse-Mode SiGe HBTs as Switching Pairs for SET-Mitigated RF Mixers

John D. Cressler, Jeffrey H. Warner, Ickhyun Song, 2016, IEEE Transactions on Nuclear Science.

Single-Event Transient and Total Dose Response of Precision Voltage Reference Circuits Designed in a 90-nm SiGe BiCMOS Technology

Laleh Najafizadeh, John D. Cressler, En Xia Zhang, 2014, IEEE Transactions on Nuclear Science.

Fundamentals of the Pulsed Laser Technique for Single-Event Upset Testing

Dean Lewis, Pascal Fouillat, Vincent Pouget, 2007 .

A Dosimetry Methodology for Two-Photon Absorption Induced Single-Event Effects Measurements

Jeffrey H. Warner, Joseph S. Melinger, Ani Khachatrian, 2014, IEEE Transactions on Nuclear Science.

Simulation of Laser-Based Two-Photon Absorption Induced Charge Carrier Generation in Silicon

Ani Khachatrian, Joel M. Hales, Dale McMorrow, 2015, IEEE Transactions on Nuclear Science.

An Investigation of Single-Event Effects and Potential SEU Mitigation Strategies in Fourth-Generation, 90 nm SiGe BiCMOS

John D. Cressler, Jeffrey H. Warner, David Harame, 2013, IEEE Transactions on Nuclear Science.

Optimization of SiGe HBT RF Switches for Single-Event Transient Mitigation

John D. Cressler, Jeffrey H. Warner, Ickhyun Song, 2015, IEEE Transactions on Nuclear Science.

Single-Event Effects in High-Frequency Linear Amplifiers: Experiment and Analysis

John D. Cressler, Hanbin Ying, Jeffrey H. Warner, 2017, IEEE Transactions on Nuclear Science.

Single-Event Effects in a W-Band (75-110 GHz) Radar Down-Conversion Mixer Implemented in 90 nm, 300 GHz SiGe HBT Technology

John D. Cressler, Jeffrey H. Warner, Ickhyun Song, 2015, IEEE Transactions on Nuclear Science.

Radiation Hardness Assurance (RHA) for Space Systems

Christian Poivey, Stephen P. Buchner, 2007 .

Current Single Event Effects Compendium of Candidate Spacecraft Electronics for NASA

Farokh Irom, Kenneth A. LaBel, Martha V. O'Bryan, 2010, 2010 IEEE Radiation Effects Data Workshop.

Design of Radiation-Hardened RF Low-Noise Amplifiers Using Inverse-Mode SiGe HBTs

John D. Cressler, Jeffrey H. Warner, Ickhyun Song, 2014, IEEE Transactions on Nuclear Science.

An Investigation of Single-Event Transients in C-SiGe HBT on SOI Current Mirror Circuits

John D. Cressler, Jeffrey H. Warner, Ickhyun Song, 2014, IEEE Transactions on Nuclear Science.

Single-Event Transient Response of Comparator Pre-Amplifiers in a Complementary SiGe Technology

Mehmet Kaynak, John D. Cressler, Jeffrey H. Warner, 2017, IEEE Transactions on Nuclear Science.

Pulsed laser-induced single event upset and charge collection measurements as a function of optical penetration depth

A. B. Campbell, Joseph S. Melinger, Dale McMorrow, 1998 .

Single Event Effects Compendium of Candidate Spacecraft Electronics for NASA

Kenneth A. LaBel, Michael J. Campola, Martha V. O'Bryan, 2009, 2009 IEEE Radiation Effects Data Workshop.

Single-Event Upsets in Substrate-Etched CMOS SOI SRAMs Using Ultraviolet Optical Pulses With Sub-Micrometer Spot Size

Jeffrey H. Warner, Vincent Pouget, Joseph S. Melinger, 2013, IEEE Transactions on Nuclear Science.

Testing and Hardness Assurance Guidelines for Single Event Transients (SETs) in Linear Devices

Ken LaBel, C. Poivey, C. Poivey, 2005 .

The Role of Negative Feedback Effects on Single-Event Transients in SiGe HBT Analog Circuits

John D. Cressler, Jeffrey H. Warner, Ickhyun Song, 2015, IEEE Transactions on Nuclear Science.

Testing Guidelines for Single Event Transient (SET) Testing of Linear Devices

Ken LaBel, C. Poivey, C. Poivey, 2003 .

Probing the SEB Sensitive Depth of a Power MOSFET Using a Two-Photon Absorption Laser Method

Kenneth A. LaBel, Jeffrey H. Warner, Megan C. Casey, 2011 .

The Impact of Technology Scaling on the Single-Event Transient Response of SiGe HBTs

John D. Cressler, Jeffrey H. Warner, Adrian Ildefonso, 2017, IEEE Transactions on Nuclear Science.

On the Application of Inverse-Mode SiGe HBTs in RF Receivers for the Mitigation of Single-Event Transients

Adrian Ildefonso, Ickhyun Song, Moon-Kyu Cho, 2017, IEEE Transactions on Nuclear Science.