Nikolaus Gouders

PARIS: a parallel pattern fault simulator for synchronous sequential circuits

Nikolaus Gouders, Reinhard Kaibel, 1991, 1991 IEEE International Conference on Computer-Aided Design Digest of Technical Papers.

Test generation techniques for sequential circuits

Nikolaus Gouders, Reinhard Kaibel, 1991, Digest of Papers 1991 VLSI Test Symposium 'Chip-to-System Test Concerns for the 90's.