Soidri Bastoini

For Peer Review Only Optimization of the process control in a semiconductor company. Model and case study of defectivity sampling

Samuel Bassetto, Philippe Vialletelle, M. Shanoun, 2011 .

Computation of Wafer-At-Risk from Theory to Real Life Demonstration

M'Hammed Sahnoun, Michel Tollenaere, Samuel Bassetto, 2010 .

Optimisation of the process control in a semiconductor company: model and case study of defectivity sampling

Samuel Bassetto, Philippe Vialletelle, M. Shanoun, 2011 .

Optimizing return on inspection trough defectivity smart sampling

Michel Tollenaere, Samuel Bassetto, Philippe Vialletelle, 2010, 2010 International Symposium on Semiconductor Manufacturing (ISSM).