Bertrand Boudart

发表

Total ionising dose effects on punch-through insulated gate bipolar transistors turn-on switching behaviour

Amrane Oukaour, Hamid Gualous, Boubekeur Tala-Ighil, 2011, Microelectron. Reliab..

Hot carrier aging degradation phenomena in GaN based MESFETs

Gaudenzio Meneghesso, Christophe Gaquiere, Enrico Zanoni, 2004 .

Ageing defect detection on IGBT power modules by artificial training methods based on pattern recognition

Amrane Oukaour, Stéphane Lefebvre, M. Bouarroudj-Berkani, 2011, Microelectron. Reliab..

Comparative studies of Pt and Ir schottky contacts on undoped Al0.36Ga0.64N

E. Delos, Bertrand Boudart, Marianne Germain, 2006, Microelectron. Reliab..

Annihilation of electrical trap effects by irradiating AlGaN/GaN HEMTs with low thermal neutrons radiation fluence

Hamid Gualous, Bertrand Boudart, Jean-Lionel Trolet, 2012, Microelectron. Reliab..

Hot carrier aging degradation phenomena in GaN based MESFETs

Gaudenzio Meneghesso, Enrico Zanoni, Fabiana Rampazzo, 2004, Microelectronics and reliability.

Calendar and cycling ageing of activated carbon supercapacitor for automotive application

Amrane Oukaour, Hamid Gualous, R. Gallay, 2012, Microelectron. Reliab..

Influence of recess and epilayers in the 26 – 40 GHz band HEMT’s intermodulation

Y. Crosnier, D. Pons, C. Gaquiere, 2000 .

Degradation in polysilicon thin film transistors related to the quality of the polysilicon material

Olivier Bonnaud, Jean-François Llibre, Taieb Mohammed-Brahim, 2003, Microelectron. Reliab..

Supercapacitor ageing at constant temperature and constant voltage and thermal shock

Amrane Oukaour, Hamid Gualous, R. Gallay, 2010, Microelectron. Reliab..

Characterization of high-voltage IGBT module degradations under PWM power cycling test at high ambient temperature

Amrane Oukaour, Hamid Gualous, Djamil Aïssani, 2010, Microelectron. Reliab..

Comparison Between the Behaviour of Punch-Through and Non-Punch-Through Insulated Gate Bipolar Transistors Under High Temperature Reverse Bias Stress

Boubekeur Tala-Ighil, Bertrand Boudart, Hamid Toutah, 2004, Microelectron. Reliab..

Calendar ageing and health diagnosis of supercapacitor

Amrane Oukaour, Hamid Gualous, R. Gallay, 2013 .

Supercapacitors aging diagnosis using least square algorithm

Amrane Oukaour, Olivier Gehan, Hamid Gualous, 2013, Microelectron. Reliab..

Characterization of the self-heating of AlGaN/GaN HEMTs during an electrical stress by using Raman spectroscopy

Hamid Gualous, Bertrand Boudart, Jean-Lionel Trolet, 2011, Microelectron. Reliab..

Characterization and analysis of electrical trap related effects on the reliability of AlInN/GaN HEMTs

Bertrand Boudart, Jean-Lionel Trolet, Christophe Gaquière, 2015, Microelectron. Reliab..

Impact of low gamma radiation dose on electrical trap related effects in AlGaN/GaN HEMTs

Hamid Gualous, C. Gaquiere, Bertrand Boudart, 2012 .

High power and linearity performances of gallium nitride HEMT devices on sapphire substrate

C. Gaquiere, N. Vellas, Sylvain Delage, 2005 .