Benoit Sklenard

Method of manufacturing a transistor wherein the stress applied to the channel is increased

Shay Reboh, Perrine Batude, Frédéric Mazen, 2014 .

Study of Forming Impact on 4Kbit RRAM Array Performances and Reliability

Gilles Reimbold, Gabriel Molas, Carlo Cagli, 2017, 2017 IEEE International Memory Workshop (IMW).

A Link Between CBRAM Performances and Material Microscopic Properties Based on Electrical Characterization and Atomistic Simulations

Gérard Ghibaudo, Luca Perniola, Christophe Vallée, 2017, IEEE Transactions on Electron Devices.