C. Thompson

Electromigration-induced failures in interconnects with bimodal grain size distributions

Carl V. Thompson, J. Cho, J. Cho, 1990 .

Capillary instabilities in thin films

Carl V. Thompson, C. Thompson, E. Jiran, 1990 .

Effects of microstructure on interconnect and via reliability: Multimodal failure statistics

Carl V. Thompson, H. Kahn, H. Kahn, 1993 .