U Kaiser

3D Imaging of Nanomaterials by Discrete Tomography

S Bals, K J Batenburg, J Sijbers, 2006, Microscopy and Microanalysis.

Transmission electron microscopy at 20 kV for imaging and spectroscopy.

U Kaiser, J. Meyer, J. Biskupek, 2011, Ultramicroscopy.

The influence of inelastic scattering on EFTEM images--exemplified at 20 kV for graphene and silicon.

U Kaiser, U. Kaiser, H. Rose, 2013, Ultramicroscopy.

Significance of matrix diagonalization in modelling inelastic electron scattering.

U Kaiser, U. Kaiser, H. Rose, 2017, Ultramicroscopy.