Hyungik Lee

发表

Ultralow-dielectric-constant amorphous boron nitride

S. Roche, T. Shin, Juyoung Kim, 2020, Nature.

A field-emission display with a self-focus cathode electrode

Sung-Wook Kang, J. M. Kim, C. G. Lee, 2003 .

Sub-nm depth resolution in sputter depth profiling by low energy ion bombardment

Hee-jae Kang, D. Moon, S. Oh, 2004 .

High‐resolution Auger depth profiling by sub‐keV ion sputtering

M. Inoue, R. Shimizu, Hyung‐Ik Lee, 2005 .

In-depth concentration distribution of Ar in Si surface after low-energy Ar+ ion sputtering

D. Oh, H. J. Kang, Hyung‐Ik Lee, 2002 .

Dynamic Monte Carlo simulation for depth profiling by ion-sputter etching: Application to the AlAs/GaAs multilayered system

R. Shimizu, Hyungik Lee, 1998 .

Damage profiles of Si (001) surface via Ar cluster beam sputtering

Jae Cheol Lee, Sung Heo, Y. Kyoung, 2013 .

Estimation of the electronic straggling using delta-doped multilayers

Y. Kido, Ki-Bok Kim, D. Moon, 2001 .

Surface characterization for sputter-cone formation on InP(100)

T. Akita, R. Shimizu, Hyungik Lee, 1998 .

Band gap and defect states of MgO thin films investigated using reflection electron energy loss spectroscopy

G. Park, P. Choi, Byoungdeog Choi, 2015 .

Band alignment of atomic layer deposited (HfZrO{sub 4}){sub 1−x}(SiO{sub 2}){sub x} gate dielectrics on Si (100)

Jae Cheol Lee, G. Park, P. Choi, 2015 .

Defect visualization of Cu(InGa)(SeS)2 thin films using DLTS measurement

G. Park, Jong-bong Park, J. Nam, 2016, Scientific Reports.

Prediction of Wetting and Interfacial Property of CNT Reinforced Epoxy on CF Tow Using Electrical Resistance Method

Joung-Man Park, D. Kwon, P. Shin, 2015 .

Carbon nanotube electron emitters with a gated structure using backside exposure processes

Jae Eun Jang, Jo-Won Lee, Seong-Ho Cho, 2002 .

Chemical/morphological transition behavior of lithium phosphorus oxynitride solid-electrolyte in air: An analytical approach based on X-ray photoelectron spectroscopy and atomic force microscopy

Kihong Kim, Eunha Lee, S. Lim, 2018, Journal of Power Sources.

Damage-Free Photoemission Study of Conducting Carbon Composite Electrode Using Ar Gas Cluster Ion Beam Sputtering Process

A. Benayad, C. Jung, D. Yun, 2012 .

Bandgap measurement of thin dielectric films using monochromated STEM-EELS.

G. Park, Kihong Kim, Sung Heo, 2009, Ultramicroscopy.

Electronic structures of SiO2 thin films via Ar gas cluster ion beam sputtering

Jae Cheol Lee, D. Yun, Yong Su Kim, 2014 .

Defect states in amorphous SiNx:H compounds using thermally stimulated exo-electron emission

G. Park, Kihong Kim, P. Choi, 2016 .

Absolute In coverage and bias-dependent STM images of the Si(111)4×1-In surface

Hanchul Kim, J. Koo, D. Moon, 2003 .

High‐Throughput Growth of Wafer‐Scale Monolayer Transition Metal Dichalcogenide via Vertical Ostwald Ripening

Jiwoong Park, M. Seol, Yeonchoo Cho, 2020, Advanced materials.

Pt-doped Ni-silicide films formed by pulsed-laser annealing: Microstructural evolution and thermally robust Ni1-xPtxSi2 formation

Hyoungsub Kim, Ilgyou Shin, Tae-Gon Kim, 2019, Journal of Alloys and Compounds.

Chemically Homogeneous and Thermally Robust Ni1-xPtxSi Film Formed Under a Non-Equilibrium Melting/Quenching Condition.

Chulsung Kim, Hyoungsub Kim, Eunha Lee, 2017, ACS applied materials & interfaces.

Lamellar-structured Ni-silicide film formed by eutectic solidification

Hyoungsub Kim, Eunha Lee, Sungho Lee, 2019, Journal of Alloys and Compounds.

High-speed multibit operation of a dual vacancy-type oxide device with extended bi-polar resistive switching behaviors

Sang-jun Choi, G. Park, Soohaeng Cho, 2013 .

In situ observation of vacancy dynamics during resistance changes of oxide devices

Hyun-Joon Shin, Soohaeng Cho, Sung Heo, 2011 .

Band alignment and defect states in amorphous GaInZnO thin films grown on SiO2/Si substrates

Jae Cheol Lee, G. Park, Kihong Kim, 2016 .

High-performance and scalable metal-chalcogenide semiconductors and devices via chalco-gel routes

Jae Hyun Kim, Myoung-Jae Lee, Myung‐Gil Kim, 2018, Science Advances.

Source/Drain Formation of Self-Aligned Top-Gate Amorphous GaInZnO Thin-Film Transistors by $\hbox{NH}_{3}$ Plasma Treatment

Changjung Kim, Eunha Lee, Huaxiang Yin, 2009, IEEE Electron Device Letters.

Sputter damage in Si surface by low energy Ar+ ion bombardment

H. J. Kang, Hyung‐Ik Lee, D. Moon, 2003 .

Self-aligned top-gate amorphous gallium indium zinc oxide thin film transistors

Kee-Won Kwon, Young-soo Park, Eunha Lee, 2008 .

Interface Analysis of MIM Capacitor Using ZrN Electrodes and ALD-ZrO2 Dielectrics

J. Moon, Hyejung Choi, Younsoo Kim, 2010 .

Direct band gap measurement of Cu(In,Ga)(Se,S)2 thin films using high-resolution reflection electron energy loss spectroscopy

G. Park, Jong-bong Park, D. Ko, 2015 .

Atomic Scale Interface Analysis with MEIS for Nano-Electronics Technology

K. J. Kim, Hanchul Kim, D. Moon, 2002 .