Shi-Jie Wen

发表

Specification and Verification of Soft Error Performance in Reliable Electronic Systems

A. L. Silburt, Adrian Evans, A. Burghelea, 2011 .

Networking industry trends in ESD protection for high speed IOs

Shi-Jie Wen, Richard Wong, Rita Fung, 2013, 2013 IEEE 10th International Conference on ASIC.

A fully integrated 40pF output capacitor beat-frequency-quantizer-based digital LDO with built-in adaptive sampling and active voltage positioning

Shi-Jie Wen, Chris H. Kim, Somnath Kundu, 2018, 2018 IEEE International Solid - State Circuits Conference - (ISSCC).

Clustering techniques and statistical fault injection for selective mitigation of SEUs in flip-flops

Adrian Evans, Shi-Jie Wen, Michael Nicolaidis, 2013, International Symposium on Quality Electronic Design (ISQED).

Quantitative SEU Fault Evaluation for SRAM-Based FPGA Architectures and Synthesis Algorithms

Shi-Jie Wen, Lei He, Zhigang Mao, 2011, 2011 21st International Conference on Field Programmable Logic and Applications.

Using Partial Duplication With Compare to Detect Radiation-Induced Failure in a Commercial FPGA-Based Networking System

Shi-Jie Wen, Rita Fung, Michael Wirthlin, 2020, 2020 IEEE International Reliability Physics Symposium (IRPS).

Single Event Resilient Dynamic Logic Designs

Rui Liu, Shi-Jie Wen, Haibin Wang, 2014, J. Electron. Test..

Correctable and uncorrectable errors using large scale DRAM DIMMs in replacement network servers

Shi-Jie Wen, Junhyeong Kwon, Sanghyeon Baeg, 2019 .

New approaches for synthesis of redundant combinatorial logic for selective fault tolerance

Adrian Evans, Dan Alexandrescu, Rui Liu, 2014, 2014 IEEE 20th International On-Line Testing Symposium (IOLTS).

Single-Event Transient Measurements on a DC/DC Pulse Width Modulator Using Heavy Ion, Proton, and Pulsed Laser

Shi-Jie Wen, Yi Ren, Bharat L. Bhuva, 2014, J. Electron. Test..

New DRAM HCI qualification method emphasizing on repeated memory access

Shi-Jie Wen, Pierre Chor-Fung Chia, Sang H. Baeg, 2010, 2010 IEEE International Integrated Reliability Workshop Final Report.

Terrestrial SER characterization for nanoscale technologies: A comparative study

Shi-Jie Wen, Bharat L. Bhuva, P. Marcoux, 2015, 2015 IEEE International Reliability Physics Symposium.

Specification and Verification of Soft Error Performance in Reliable Internet Core Routers

Shi-Jie Wen, A.L. Silburt, A. Evans, 2008, IEEE Transactions on Nuclear Science.

Correlation of Heavy-Ion and Laser Testing on a DC/DC PWM Controller

Shi-Jie Wen, Yi Ren, Haibin Wang, 2013, J. Electron. Test..

Building a reliable internet core using soft error prone electronics

Shi-Jie Wen, A.L. Silburt, A. Evans, 2008, 2008 IEEE International Conference on Integrated Circuit Design and Technology and Tutorial.

Mitigating the effects of large multiple cell upsets (MCUs) in memories

Shi-Jie Wen, Pedro Reviriego, Juan Antonio Maestro, 2011, TODE.

New insights into the impact of SEUs in FPGA CRAMs

Adrian Evans, Shi-Jie Wen, Sheng Wang, 2015, IEICE Electron. Express.

Accelerated assessment of fine-grain AVF in NoC using a Multi-Cell Upsets considered fault injection

Shi-Jie Wen, Yuzhuo Fu, Jiajia Jiao, 2014, Microelectron. Reliab..

A Fully Integrated Digital LDO With Built-In Adaptive Sampling and Active Voltage Positioning Using a Beat-Frequency Quantizer

Shi-Jie Wen, Chris H. Kim, Somnath Kundu, 2019, IEEE Journal of Solid-State Circuits.

RIIF - Reliability information interchange format

Adrian Evans, Dan Alexandrescu, Enrico Costenaro, 2012, 2012 IEEE 18th International On-Line Testing Symposium (IOLTS).

Error detection in Ternary CAMs using Bloom Filters

Adrian Evans, Shi-Jie Wen, Marco Ottavi, 2013, 2013 Design, Automation & Test in Europe Conference & Exhibition (DATE).

Soft error tolerant Content Addressable Memories (CAMs) using error detection codes and duplication

Shi-Jie Wen, Pedro Reviriego, Juan Antonio Maestro, 2013, Microprocess. Microsystems.

Variation of SRAM Alpha-Induced Soft Error Rate with Technology Node

Shi-Jie Wen, Erwin Schäfer, Cyrille Beltrando, 2008, 2008 14th IEEE International On-Line Testing Symposium.

A Bulk Built-In Voltage Sensor to Detect Physical Location of Single-Event Transients

Shi-Jie Wen, Yi Ren, Bharat L. Bhuva, 2013, J. Electron. Test..

Single-Event Effects Analysis of a Pulse Width Modulator IC in a DC/DC Converter

Shi-Jie Wen, Yi Ren, Bharat L. Bhuva, 2012, J. Electron. Test..

IZIP: In-place zero overhead interconnect protection via PIP redundancy

Adrian Evans, Shi-Jie Wen, Yi Luo, 2017, 2017 IEEE 12th International Conference on ASIC (ASICON).

Study of proton radiation effect to row hammer fault in DDR4 SDRAMs

Shi-Jie Wen, Kyungbae Park, Sanghyeon Baeg, 2018, Microelectron. Reliab..

Synthesis of Redundant Combinatorial Logic for Selective Fault Tolerance

Adrian Evans, Shi-Jie Wen, Li Chen, 2013, 2013 IEEE 19th Pacific Rim International Symposium on Dependable Computing.

Logic soft error study with 800-MHz DDR3 SDRAMs in 3x nm using proton and neutron beams

Shi-Jie Wen, Kyungbae Park, Sanghyeon Baeg, 2015, 2015 IEEE International Reliability Physics Symposium.

Heterogeneous configuration memory scrubbing for soft error mitigation in FPGAs

Shi-Jie Wen, Lei He, Richard Wong, 2012, 2012 International Conference on Field-Programmable Technology.

A 65 nm Temporally Hardened Flip-Flop Circuit

Qiong Wu, Mo Chen, Shi-Jie Wen, 2016, IEEE Transactions on Nuclear Science.

Performance, metastability and soft-error robustness tradeoffs for flip-flops in 40nm CMOS

Shi-Jie Wen, Bharat L. Bhuva, David Li, 2011, 2011 IEEE Custom Integrated Circuits Conference (CICC).

Effects of multi-node charge collection in flip-flop designs at advanced technology nodes

Shi-Jie Wen, Rick Wong, Vijay B Sheshadri, 2010, 2010 IEEE International Reliability Physics Symposium.

Analysis of advanced circuits for SET measurement

Adrian Evans, Rui Liu, Shi-Jie Wen, 2015, 2015 IEEE International Reliability Physics Symposium.

High frequency AC electromigration lifetime measurements from a 32nm test chip

Shi-Jie Wen, Chris H. Kim, Xiaofei Wang, 2015, 2015 Symposium on VLSI Technology (VLSI Technology).

A Systematical Method of Quantifying SEU FIT

Dan Alexandrescu, Shi-Jie Wen, Renaud Perez, 2008, 2008 14th IEEE International On-Line Testing Symposium.

Modeling and analysis of single-event transient sensitivity of a 65 nm clock tree

Rui Liu, Mo Chen, Shi-Jie Wen, 2018, Microelectron. Reliab..

Spatio-temporal AI inference engine for estimating hard disk reliability

Shi-Jie Wen, Abhishek Dubey, Saptarshi Sengupta, 2021, Pervasive Mob. Comput..

Placement of repair circuits for in-field FPGA repair

Shi-Jie Wen, Alex Wilson, Michael J. Wirthlin, 2013, FPGA '13.

Design for Soft Error Resiliency in Internet Core Routers

Shi-Jie Wen, A.L. Silburt, A. Evans, 2009, IEEE Transactions on Nuclear Science.

Assessing alpha-particle-induced SEU sensitivity of flip-chip bonded SRAM using high energy irradiation

Shi-Jie Wen, Sanghyeon Baeg, Saqib A. Khan, 2016, IEICE Electron. Express.

Timing Vulnerability Factors of Ultra Deep-sub-micron CMOS

Mark Zwolinski, Shi-Jie Wen, Richard Wong, 2011, 2011 Sixteenth IEEE European Test Symposium.

Minimizing Soft Errors in TCAM Devices: A Probabilistic Approach to Determining Scrubbing Intervals

Shi-Jie Wen, Sanghyeon Baeg, Richard Wong, 2010, IEEE Transactions on Circuits and Systems I: Regular Papers.

Temporal and frequency characteristic analysis of margin-related failures caused by an intermittent nano-scale fracture of the solder ball in a BGA package device

Shi-Jie Wen, Sanghyeon Baeg, Hosung Lee, 2017, Microelectron. Reliab..

Performance, Metastability, and Soft-Error Robustness Trade-offs for Flip-Flops in 40 nm CMOS

Shi-Jie Wen, Bharat L. Bhuva, S. Jagannathan, 2012, IEEE Trans. Circuits Syst. I Regul. Pap..

System level EOS case studies not due to excessive voltages

Shi-Jie Wen, Richard Wong, Rita Fung, 2013, 2013 35th Electrical Overstress/Electrostatic Discharge Symposium.

Design and Analysis of Low-Voltage Low-Parasitic ESD Protection for RF ICs in CMOS

Jian Liu, Hui Zhao, Shi-Jie Wen, 2011, IEEE Journal of Solid-State Circuits.