Mafalda Cortez

发表

Giorgio Di Natale, Said Hamdioui, Mafalda Cortez, 2014 .

Testing Methods for PUF-Based Secure Key Storage Circuits

Giorgio Di Natale, Said Hamdioui, Mafalda Cortez, 2014, J. Electron. Test..

Modeling SRAM start-up behavior for Physical Unclonable Functions

Said Hamdioui, Geert Jan Schrijen, Apurva Dargar, 2012, 2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT).

Testing PUF-based secure key storage circuits

Giorgio Di Natale, Said Hamdioui, Mafalda Cortez, 2014, 2014 Design, Automation & Test in Europe Conference & Exhibition (DATE).

Adapting voltage ramp-up time for temperature noise reduction on memory-based PUFs

Said Hamdioui, Geert Jan Schrijen, Roel Maes, 2013, 2013 IEEE International Symposium on Hardware-Oriented Security and Trust (HOST).

Hierarchical Secure DfT

Giorgio Di Natale, Bruno Rouzeyre, Said Hamdioui, 2015 .

Intelligent Voltage Ramp-Up Time Adaptation for Temperature Noise Reduction on Memory-Based PUF Systems

Said Hamdioui, Geert Jan Schrijen, Roel Maes, 2015, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems.

Multi-segment Enhanced Scan-chains for Secure ICs

Giorgio Di Natale, Bruno Rouzeyre, Said Hamdioui, 2015 .

Design dependent SRAM PUF robustness analysis

Said Hamdioui, Ryoichi Ishihara, Mafalda Cortez, 2015, 2015 16th Latin-American Test Symposium (LATS).