C. Auricchio

A Flash technology programmable non-volatile switch

A. Maurelli, M. Borgatti, C. Auricchio, 2003, ESSDERC '03. 33rd Conference on European Solid-State Device Research, 2003..

TestStructure forProcess andProduct Evaluation

C. Auricchio, Bertrand Borot, J. Vast, 2007 .

A multi-context 6.4Gb/s/channel on-chip communication network using 0.18/spl mu/m Flash-EEPROM switches and elastic interconnects

M. Borgatti, R. Canegallo, C. Auricchio, 2003, 2003 IEEE International Solid-State Circuits Conference, 2003. Digest of Technical Papers. ISSCC..

Test Structure for Process and Product Evaluation

H. Aziza, J.M. Portal, B. Borot, 2007, 2007 IEEE International Conference on Microelectronic Test Structures.

Narrow width effects in CMOS n(p)-well resistors

Roberto Bez, C. Auricchio, A. Grossi, 1996, Proceedings of International Conference on Microelectronic Test Structures.

A Triple-well Architecture for Low-voltage Operation in Submicron CMOS Devices

P. Zabberoni, R. Bez, A. Maurelli, 1996, ESSDERC '96: Proceedings of the 26th European Solid State Device Research Conference.