Y. Akue Allogo

Low frequency noise characterization in 0.13 mum p-MOSFETs. Impact of scaled-down 0.25, 0.18 and 0.13 mum technologies on 1/f noise

P. Llinares, J. C. Vildeuil, M. Marin, 2004, Microelectron. Reliab..

1/f noise in 0.18 μm technology n-MOSFETs from subthreshold to saturation

M. Marin, P. Llinares, Y. Akue Allogo, 2002 .

1/f noise measurements in n-channel MOSFETs processed in 0.25 μm technology: Extraction of BSIM3v3 noise parameters

P. Llinares, M. Valenza, J. C. Vildeuil, 2002 .