H. Pein

Performance of the 3-D sidewall flash EPROM cell

James D. Plummer, H. Pein, H. Pein, 1993, Proceedings of IEEE International Electron Devices Meeting.

Performance of the 3-D PENCIL flash EPROM cell and memory array

James D. Plummer, H. Pein, J. Plummer, 1995 .

A 3-D sidewall flash EPROM cell and memory array

James D. Plummer, H. Pein, 1993 .

A trench-gate LIGBT structure and two LMCT structures in SOI substrates

James D. Plummer, H. Pein, D. R. Disney, 1994, Proceedings of the 6th International Symposium on Power Semiconductor Devices and Ics.

Dependence of breakdown voltage on drift length and buried oxide thickness in SOI RESURF LDMOS transistors

Theodore Letavic, Satyendranath Mukherjee, Steven L. Merchant, 1993, [1993] Proceedings of the 5th International Symposium on Power Semiconductor Devices and ICs.

Comparison of self-heating effects in bulk-silicon and SOI high-voltage devices

H. Pein, E. Arnold, E. Arnold, 1994, Proceedings of 1994 IEEE International Electron Devices Meeting.

High-breakdown-voltage devices in ultra-thin SOI

Subrata Mukherjee, Helmut Baumgart, H. Pein, 1991, 1991 IEEE International SOI Conference Proceedings.