A.K.M. Mahfuzul Islam

Effect of Logic Depth ad Switching Speed on Random Telegraph Noise Induced Delay Fluctuation

Hidetoshi Onodera, Ryota Shimizu, A.K.M. Mahfuzul Islam, 2019, 2019 IEEE 32nd International Conference on Microelectronic Test Structures (ICMTS).

A statistical modeling methodology of RTN gate size dependency based on skewed ring oscillators

Hidetoshi Onodera, A.K.M. Mahfuzul Islam, Tatsuya Nakai, 2017, 2017 International Conference of Microelectronic Test Structures (ICMTS).

Feature Extraction, Performance Analysis and System Design Using the DU Mobility Dataset

Md. Atiqur Rahman Ahad, Md Atiqur Rahman Ahad, A.K.M. Mahfuzul Islam, 2018, IEEE Access.