D. McMorrow

J. Melinger, R. Farrer, J. Fourkas, 2000, Nonlinear Optics: Materials, Fundamentals, and Applications. Technical Digest. Postconference Edition. TOPS Vol.46 (IEEE Cat. No.00CH37174).

Locally ordered structures in molecular liquids revealed with femtosecond Fourier-transform Raman spectroscopy

J. Melinger, W. Lotshaw, N. Thantu, 1994, Ultrafast Phenomena.

Probing the Microscopic Molecular Environment in Liquids with Femtosecond Fourier-Transform Raman Spectroscopy

J. Melinger, W. Lotshaw, S. K. Kim, 1992, Eighth International Conference on Ultrafast Phenomena.

Dephasing and relaxation in coherently excited ensembles of intermolecular oscillators

D. Mcmorrow, W. Lotshaw, D. McMorrow, 1991 .

Synchronously pumped, femtosecond dye laser insensitive to cavity-length variations of up to 15 microm.

W. Lotshaw, G. Kenney-Wallace, D. McMorrow, 1989, Optics letters.

The contribution of nuclear reactions to heavy ion single event upset cross-section measurements in a high-density SEU hardened SRAM

D. McMorrow, B.D. Olson, peixiong zhao, 2005, IEEE Transactions on Nuclear Science.

Device-Physics-Based Analytical Model for Single-Event Transients in SOI CMOS Logic

H. Ikeda, T. Makino, D. Kobayashi, 2009, IEEE Transactions on Nuclear Science.

Examination of Trapping Effects on Single-Event Transients in GaN HEMTs

Michael R. Hontz, D. Georgiev, K. Hobart, 2023, IEEE Transactions on Nuclear Science.

Characteristics and Applications of Pulsed Laser-Induced Single-Event Effects

Dale McMorrow, D. McMorrow, 2019, Radiation Effects on Integrated Circuits and Systems for Space Applications.

Large SET Duration Broadening in a Fully-Depleted SOI Technology—Mitigation With Body Contacts

A Zadeh, V Ferlet-Cavrois, O. Flament, 2009, IEEE Transactions on Nuclear Science.

Single-event effects on ultra-low power CMOS circuits

T. Daniel Loveless, Lloyd W. Massengill, T. D. Loveless, 2009, 2009 IEEE International Reliability Physics Symposium.

A New Technique for SET Pulse Width Measurement in Chains of Inverters Using Pulsed Laser Irradiation

P Paillet, M R Shaneyfelt, N Fel, 2008, IEEE Transactions on Nuclear Science.

Investigation of the Propagation Induced Pulse Broadening (PIPB) Effect on Single Event Transients in SOI and Bulk Inverter Chains

J. Melinger, P. Dodd, D. Mcmorrow, 2008, IEEE Transactions on Nuclear Science.

Transient Radiation Response of Single- and Multiple-Gate FD SOI Transistors

O. Faynot, S. Cristoloveanu, M. Gaillardin, 2007, IEEE Transactions on Nuclear Science.

New Insights Into Single Event Transient Propagation in Chains of Inverters—Evidence for Propagation-Induced Pulse Broadening

M. Gaillardin, J. Baggio, N. Fel, 2007, IEEE Transactions on Nuclear Science.

Propagating SET Characterization Technique for Digital CMOS Libraries

O.A. Amusan, A. Witulski, M.P. Baze, 2006, IEEE Transactions on Nuclear Science.

On-Chip Characterization of Single-Event Transient Pulsewidths

B. Narasimham, W. T. Holman, V. Ramachandran, 2006, IEEE Transactions on Device and Materials Reliability.

Direct measurement of transient pulses induced by laser and heavy ion irradiation in deca-nanometer devices

O. Faynot, M. Gaillardin, L. Tosti, 2005, IEEE Transactions on Nuclear Science.

Modeling single-event effects in a complex digital device

D. J. Fouts, T. R. Weatherford, Dale McMorrow, 2003 .

Comparison of error rates in combinational and sequential logic

M. Baze, S. Buchner, D. Brown, 1997 .

RADIATION EFFECTS IN III-V SEMICONDUCTOR ELECTRONICS

Dale McMorrow, L. Cohn, B. Weaver, 2003 .

Single-event upset in flip-chip SRAM induced by through-wafer, two-photon absorption

S. Buchner, J. Melinger, D. Mcmorrow, 2005, IEEE Transactions on Nuclear Science.

Ultrafast Dynamics of Electronic Excitations in a Light-Harvesting Phenylacetylene Dendrimer

Dale McMorrow, D. Mcmorrow, V. Kleiman, 2001 .

3D knife-edge characterization of two-photon absorption volume in silicon for integrated circuit testing.

V. Pouget, D. Lewis, E. Faraud, 2011, Optics express.

Aggregation effects on the optical properties of a light harvesting phenylacetylene dendrimer in non-polar solution

J. Melinger, D. Mcmorrow, Zhonghua Peng, 2004 .

Measurement and Analysis of Interconnect Crosstalk Due to Single Events in a 90 nm CMOS Technology

B.L. Bhuva, O.A. Amusan, S.A. Nation, 2008, IEEE Transactions on Nuclear Science.

Single event effects in circuit-hardened SiGe HBT logic at gigabit per second data rates

R. Reed, S. Buchner, M. Carts, 2000 .

Pulsed-Laser Testing for Single-Event Effects Investigations

V. Pouget, F. Miller, S. P. Buchner, 2013, IEEE Transactions on Nuclear Science.

An Electrostatic Discharge Protection Circuit Technique for the Mitigation of Single-Event Transients in SiGe BiCMOS Technology

Zachary E. Fleetwood, S. Buchner, J. Cressler, 2018, IEEE Transactions on Nuclear Science.

The Effect of the Gate-Connected Field Plate on Single-Event Transients in AlGaN/GaN Schottky-Gate HEMTs

S. Buchner, A. Koehler, A. Khachatrian, 2019, IEEE Transactions on Nuclear Science.

Spatial Mapping of Pristine and Irradiated AlGaN/GaN HEMTs With UV Single-Photon Absorption Single-Event Transient Technique

S. Buchner, A. Koehler, T. Anderson, 2016, IEEE Transactions on Nuclear Science.

The Use of Inverse-Mode SiGe HBTs as Active Gain Stages in Low-Noise Amplifiers for the Mitigation of Single-Event Transients

John D. Cressler, Ickhyun Song, Zachary E. Fleetwood, 2017, IEEE Transactions on Nuclear Science.

Comparative OHD-RIKES and THz-TDS Probes of Ultrafast Structural Dynamics in Molecular Liquids

D. Mcmorrow, E. Heilweil, T. Korter, 2004 .

Comparison of Single-Event Transients in an Epitaxial Silicon Diode Resulting From Heavy-Ion-, Focused X-Ray-, and Pulsed Laser-Induced Charge Generation

peixiong zhao, R. Reed, E. Zhang, 2021, IEEE Transactions on Nuclear Science.

Comparison of Sensitive Volumes Associated With Ion- and Laser-Induced Charge Collection in an Epitaxial Silicon Diode

peixiong zhao, R. Reed, E. Zhang, 2020, IEEE Transactions on Nuclear Science.

Variable Depth Bragg Peak Method for Single Event Effects Testing

S. Buchner, D. Mcmorrow, P. O'Neill, 2011, IEEE Transactions on Nuclear Science.

Optical and photophysical properties of light-harvesting phenylacetylene monodendrons based on unsymmetrical branching.

J. Melinger, D. Mcmorrow, Zhonghua Peng, 2002, Journal of the American Chemical Society.

The effects of total ionizing dose on the transient response of SiGe BiCMOS technologies

Zachary E. Fleetwood, Mason T. Wachter, George N. Tzintzarov, 2016, 2016 16th European Conference on Radiation and Its Effects on Components and Systems (RADECS).

Impact of Cumulative Irradiation Degradation and Circuit Board Design on the Parameters of ASETs Induced in Discrete BJT-based Circuits

S. Buchner, D. Mcmorrow, P. McMarr, 2015, IEEE Transactions on Nuclear Science.

An Investigation of the SET Response of Devices and Differential Pairs in a 32-nm SOI CMOS Technology

Zachary E. Fleetwood, S. Buchner, J. Cressler, 2015, IEEE Transactions on Nuclear Science.

Effects of Ionizing Radiation on Digital Single Event Transients in a 180-nm Fully Depleted SOI Process

B. Narasimham, B.L. Bhuva, D. McMorrow, 2009, IEEE Transactions on Nuclear Science.

Total dose effects on error rates in linear bipolar systems

D. McMorrow, S. Buchner, L. Dusseau, 2007, 2007 9th European Conference on Radiation and Its Effects on Components and Systems.

The Effects of Low Dose-Rate Ionizing Radiation on the Shapes of Transients in the L>M124 Operational Amplifier

D. McMorrow, S. Buchner, L. Dusseau, 2008, IEEE Transactions on Nuclear Science.

Comparative study of stimulated proton-transfer luminescence of three chromones

D. Mcmorrow, M. Kasha, D. Parthenopoulos, 1991 .

Gate Bias Dependence of Single Event Charge Collection in AlSb/InAs HEMTs

J. B. Boos, peixiong zhao, R. Reed, 2009, IEEE Transactions on Nuclear Science.

The Impact of Metal Line Reflections on Through-Wafer TPA SEE Testing

R. Reed, S. Buchner, J. Warner, 2015, IEEE Transactions on Nuclear Science.

A Comparison of Single-Event Transients in Pristine and Irradiated ${{\rm Al}_{0.3}}{{\rm Ga}_{0.7}}{{\rm N}/{\rm GaN}}$ HEMTs using Two-Photon Absorption and Heavy Ions

S. Buchner, D. Mcmorrow, V. Ferlet-Cavrois, 2015, IEEE Transactions on Nuclear Science.

Dynamics and Coherent Control of Condensed Phase Vibrational Coherences

J. Melinger, V. Kleiman, D. McMorrow, 2000 .

Simulation of Light-Matter Interaction and Two-Photon Absorption Induced Charge Deposition by Ultrashort Optical Pulses in Silicon

J. Perry, S. Buchner, J. Melinger, 2014, IEEE Transactions on Nuclear Science.

Utilizing SiGe HBT Power Detectors for Sensing Single-Event Transients in RF Circuits

John D. Cressler, Jeffrey H. Warner, Adrian Ildefonso, 2018, IEEE Transactions on Nuclear Science.

Using Bessel beams and two-photon absorption to predict radiation effects in microelectronics.

Adrian Ildefonso, George N. Tzintzarov, Ani Khachatrian, 2019, Optics express.

Comparison of SETs in bipolar linear circuits generated with an ion microbeam, laser light, and circuit simulation

D. S. Walsh, Lloyd W. Massengill, R. L. Pease, 2002 .

Single-event dynamics of high-performance HBTs and GaAs MESFETs

A. B. Campbell, T. R. Weatherford, Joseph S. Melinger, 1993 .

Proton-Induced Transient Charge Collection in GaAs and InAlSb/InAs-Based FETs

J. B. Boos, peixiong zhao, R. Reed, 2013, IEEE Transactions on Nuclear Science.

Single-Event Transient Sensitivity of InAlSb/InAs/AlGaSb High Electron Mobility Transistors

J. B. Boos, peixiong zhao, R. Reed, 2012, IEEE Transactions on Nuclear Science.

Analysis of Single-Event Transients (SETs) Using Machine Learning (ML) and Ionizing Radiation Effects Spectroscopy (IRES)

L. W. Massengill, T. D. Loveless, D. McMorrow, 2021, IEEE Transactions on Nuclear Science.

SINGLE-EVENT EFFECTS IN III-V SEMICONDUCTOR ELECTRONICS

J. Melinger, A. Knudson, D. McMorrow, 2004 .

Pulsed laser-induced transient currents in bulk and silicon-on-insulator FinFETs

E. Simoen, C. Claeys, S. Cristoloveanu, 2011, 2011 International Reliability Physics Symposium.

Total Dose Effect on the Propagation of Single Event Transients in a CMOS Inverter String

P. Eaton, S. Buchner, D. Mcmorrow, 2009, IEEE Transactions on Nuclear Science.

Laser probing of bipolar amplification in 0.25-/spl mu/m MOS/SOI transistors

J. Pelloie, O. Musseau, S. Buchner, 2000 .

SiGe HBT Profiles With Enhanced Inverse-Mode Operation and Their Impact on Single-Event Transients

Zachary E. Fleetwood, Mason T. Wachter, George N. Tzintzarov, 2018, IEEE Transactions on Nuclear Science.

The Impact of Technology Scaling on the Single-Event Transient Response of SiGe HBTs

John D. Cressler, Jeffrey H. Warner, Adrian Ildefonso, 2017, IEEE Transactions on Nuclear Science.

Using TCAD Modeling to Compare Heavy-Ion and Laser-Induced Single Event Transients in SiGe HBTs

John D. Cressler, Jeffrey H. Warner, Adrian Ildefonso, 2017, IEEE Transactions on Nuclear Science.

Impact of Total Ionizing Dose on the Analog Single Event Transient Sensitivity of a Linear Bipolar Integrated Circuit

J. Boch, K. LaBel, R. Ecoffet, 2007, IEEE Transactions on Nuclear Science.

A comparative study of heavy-ion and proton-induced bit-error sensitivity and complex burst-error modes in commercially available high-speed SiGe BiCMOS

R. Reed, D. McMorrow, C. Seidleck, 2004, IEEE Transactions on Nuclear Science.

TPA Laser and Heavy-Ion SEE Testing: Complementary Techniques for SDRAM Single-Event Evaluation

M.D. Berg, D. McMorrow, S.P. Buchner, 2009, IEEE Transactions on Nuclear Science.

A digital CMOS design technique for SEU hardening

M. Baze, S. Buchner, D. Mcmorrow, 2000 .

A Generalized Linear Model for Single Event Transient Propagation in Phase-Locked Loops

T. D. Loveless, D. Mcmorrow, L. Massengill, 2010, IEEE Transactions on Nuclear Science.

A Probabilistic Analysis Technique Applied to a Radiation-Hardened-by-Design Voltage-Controlled Oscillator for Mixed-Signal Phase-Locked Loops

T. D. Loveless, R.A. Reed, B.L. Bhuva, 2008, IEEE Transactions on Nuclear Science.

A Single-Event-Hardened Phase-Locked Loop Fabricated in 130 nm CMOS

T. D. Loveless, B.L. Bhuva, T.D. Loveless, 2007, IEEE Transactions on Nuclear Science.

Investigation of Single-Event Transients in AlGaN/GaN MIS-Gate HEMTs Using a Focused X-Ray Beam

S. Buchner, A. Koehler, T. Anderson, 2019, IEEE Transactions on Nuclear Science.

Proton-transfer spectroscopy of 3-hydroxychromones: extreme sensitivity to hydrogen-bonding perturbations

D. Mcmorrow, M. Kasha, D. McMorrow, 1983 .

Temperature Dependence of Digital Single-Event Transients in Bulk and Fully-Depleted SOI Technologies

B. Narasimham, V. Ramachandran, B.L. Bhuva, 2009, IEEE Transactions on Nuclear Science.

Laboratory tests for single-event effects

S. P. Buchner, Dale McMorrow, J. S. Melinger, 1996 .

Optical Single-Event Transients Induced in Integrated Silicon-Photonic Waveguides by Two-Photon Absorption

George N. Tzintzarov, Jeffrey W. Teng, S. Buchner, 2021, IEEE Transactions on Nuclear Science.

Electronic-to-Photonic Single-Event Transient Propagation in a Segmented Mach–Zehnder Modulator in a Si/SiGe Integrated Photonics Platform

George N. Tzintzarov, Sunil G. Rao, Jeffrey W. Teng, 2020, IEEE Transactions on Nuclear Science.

Third-Order Nonlinear Optical Coefficients of Si and GaAs in the Near-Infrared Spectral Region

David J. Hagan, Eric W. Van Stryland, Joseph W. Perry, 2018, 2018 Conference on Lasers and Electro-Optics (CLEO).

Laser Dose-Rate Simulation to Complement LINAC Discrete Device Data

L. Massengill, D. McMorrow, A. Straatveit, 2008, IEEE Transactions on Nuclear Science.

PULSED LASER IRRADIATION FOR DISCRETE COMPONENT DOSE-RATE MODEL DEVELOPMENT

D. McMorrow, 2007 .

Effectiveness of SEL Hardening Strategies and the Latchup Domino Effect

B. L. Bhuva, R. D. Schrimpf, N. J. Gaspard, 2012, IEEE Transactions on Nuclear Science.

Mapping the Spatial Dependence of Charge-Collection Efficiency in Semiconductor Devices Using Pulsed-Laser Testing

S. Buchner, D. Mcmorrow, Adrian Ildefonso, 2021, IEEE Transactions on Nuclear Science.

On the Application of Inverse-Mode SiGe HBTs in RF Receivers for the Mitigation of Single-Event Transients

Adrian Ildefonso, Ickhyun Song, Moon-Kyu Cho, 2017, IEEE Transactions on Nuclear Science.

An Investigation of the Use of Inverse-Mode SiGe HBTs as Switching Pairs for SET-Mitigated RF Mixers

John D. Cressler, Jeffrey H. Warner, Ickhyun Song, 2016, IEEE Transactions on Nuclear Science.

Demonstration of single-event effects induced by through-wafer two-photon absorption

D. McMorrow, S. Buchner, S. Buchner, 2004, IEEE Transactions on Nuclear Science.

Application of a pulsed laser for evaluation and optimization of SEU-hard designs [CMOS]

T. Scott, Dale McMorrow, Nadim F. Haddad, 1999 .

Laser-Induced Latchup Screening and Mitigation in CMOS Devices

M. Baze, S. Buchner, K. Label, 2005, 2005 8th European Conference on Radiation and Its Effects on Components and Systems.

Tradeoffs Between RF Performance and SET Robustness in Low-Noise Amplifiers in a Complementary SiGe BiCMOS Platform

John D. Cressler, Jeffrey H. Warner, Adrian Ildefonso, 2020, IEEE Transactions on Nuclear Science.

The role of parasitic elements in the single-event transient response of linear circuits

Lloyd W. Massengill, R. L. Pease, Andrew L. Sternberg, 2002 .

A Simplified Approach for Predicting Pulsed-Laser-Induced Carrier Generation in Semiconductor

S. Buchner, D. Mcmorrow, J. Warner, 2017, IEEE Transactions on Nuclear Science.

Femtosecond Raman-induced Kerr effect. Temporal evolution of the vibrational normal modes in halogenated methanes☆

D. Mcmorrow, W. Lotshaw, G. Kenney-Wallace, 1988 .

Fundamentals of the Pulsed Laser Technique for Single-Event Upset Testing

Dean Lewis, Pascal Fouillat, Vincent Pouget, 2007 .