H. M. Ortner

Surfaces and materials of electrothermal atomic absorption spectrometry — more than a merely morphological study

W. Wegscheider, G. Schlemmer, V. Sychra, 1986 .

Application of X-ray fluorescence analysis with total-reflection (TXRF) in material science

H. Ortner, P. Hoffmann, K. H. Lieser, 1992 .

Comparison of the Concentrations of Chemical Components in Cloudwater Samples Collected during Four Different Field Campaigns

F. Deutsch, H. Ortner, P. Hoffmann, 2001 .