M. Friendlich

TID and SEE Response of an Advanced Samsung 4Gb NAND Flash Memory

H.S. Kim, M.D. Berg, J.W. Howard, 2007, 2007 IEEE Radiation Effects Data Workshop.

An Analysis of Single Event Upset Dependencies on High Frequency and Architectural Implementations within Actel RTAX-S Family Field Programmable Gate Arrays

Jih-Jong Wang, M. Berg, K. LaBel, 2006, IEEE Transactions on Nuclear Science.

Effectiveness of Internal Versus External SEU Scrubbing Mitigation Strategies in a Xilinx FPGA: Design, Test, and Analysis

A. Lesea, C. Poivey, M. Berg, 2008, IEEE Transactions on Nuclear Science.

A Robust Strategy for Total Ionizing Dose Testing of Field Programmable Gate Arrays

Kenneth A. LaBel, Jonathan A. Pellish, Edward P. Wilcox, 2012 .

Effectiveness of internal vs. external SEU scrubbing mitigation strategies in a Xilinx FPGA: Design, test, and analysis

A. Lesea, C. Poivey, K. LaBel, 2007, 2007 9th European Conference on Radiation and Its Effects on Components and Systems.