Norbert Seifert
发表
Aamer Jaleel,
Arijit Biswas,
Shubhendu S. Mukherjee,
2010,
HPCA - 16 2010 The Sixteenth International Symposium on High-Performance Computer Architecture.
Shah M. Jahinuzzaman,
Jyothi Velamala,
Norbert Seifert,
2015,
2015 IEEE International Reliability Physics Symposium.
Ming Zhang,
James Tschanz,
T. M. Mak,
2007,
13th IEEE International On-Line Testing Symposium (IOLTS 2007).
Norbert Seifert,
N. Seifert,
2008,
2008 14th IEEE International On-Line Testing Symposium.
Jörg Ott,
Carsten Bormann,
Norbert Seifert,
1994
.
Norbert Seifert,
Bahar Ajdari,
Samwel Sekwao,
2020,
2020 IEEE International Reliability Physics Symposium (IRPS).
Norbert Seifert,
N. Seifert,
2010,
Found. Trends Electron. Des. Autom..
Ming Zhang,
Subhasish Mitra,
Kee Sup Kim,
2006,
VLSI-SoC.
William G. Bennett,
Shashank Gupta,
Norbert Seifert,
2014,
2014 IEEE International Reliability Physics Symposium.
Ming Zhang,
Subhasish Mitra,
Tanay Karnik,
2005,
Proceedings. 42nd Design Automation Conference, 2005..
Christos A. Papachristou,
Francis G. Wolff,
Norbert Seifert,
2005,
IEEE International Conference on Test, 2005..
Pia Sanda,
Subhasish Mitra,
Norbert Seifert,
2007,
13th IEEE International On-Line Testing Symposium (IOLTS 2007).
Norbert Seifert,
Adam Neale,
N. Seifert,
2020,
IEEE Transactions on Nuclear Science.
Naresh R. Shanbhag,
Ming Zhang,
Quan Shi,
2006,
IEEE Transactions on Very Large Scale Integration (VLSI) Systems.
Ming Zhang,
Subhasish Mitra,
T. M. Mak,
2005,
IEEE International Conference on Test, 2005..
Norbert Seifert,
Arkady Bramnik,
Andrei Sherban,
2013,
2013 IEEE 19th International On-Line Testing Symposium (IOLTS).
Ming Zhang,
Subhasish Mitra,
Kee Sup Kim,
2006,
2006 IEEE International Test Conference.
Wei Wu,
Norbert Seifert,
2015,
2015 IEEE International Reliability Physics Symposium.
Ming Zhang,
Quan Shi,
Subhasish Mitra,
2005,
Computer.
Ming Zhang,
Subhasish Mitra,
T. M. Mak,
2006,
2006 IFIP International Conference on Very Large Scale Integration.
Norbert Seifert,
2008,
2008 14th IEEE International On-Line Testing Symposium.
Norbert Seifert,
2006,
12th IEEE International On-Line Testing Symposium (IOLTS'06).
Soft Error Rate Improvements in 14-nm Technology Featuring Second-Generation 3D Tri-Gate Transistors
Jyothi Velamala,
Norbert Seifert,
Jeffrey Hicks,
2015,
IEEE Transactions on Nuclear Science.
Adam Neale,
Norbert Seifert,
Samwel Sekwao,
2017,
2017 IEEE International Reliability Physics Symposium (IRPS).