Serge Pravossoudovitch

发表

Advanced Test Methods for SRAMs: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies

Arnaud Virazel, Alberto Bosio, Luigi Dilillo, 2009 .

Impact of Technology Scaling on Defects and Parameter Deviations in Embedded SRAMs

Arnaud Virazel, Luigi Dilillo, Christian Landrault, 2008 .

Low power BIST by filtering non-detecting vectors

Christian Landrault, Salvador Manich, Joan Figueras, 1999, ETW.

Mapping Test Power to Functional Power through Smart X-Filling for LOS Scheme

Xiaoqing Wen, Arnaud Virazel, Alberto Bosio, 2011 .

A History-Based Technique for Faults Diagnosis in SRAMs

Arnaud Virazel, Alberto Bosio, Patrick Girard, 2008 .

Resistive-Open Defects in core cells: Analysis and March Test Solution *

Arnaud Virazel, Patrick Girard, Simone Borri, 2004 .

New March Elements for Address Decoder Open and Resistive Open Fault Detection in SRAM Memories

Arnaud Virazel, Luigi Dilillo, Simone Borri, 2008 .

Efficient Test of Dynamic Read Destructive Faults in SRAM Memories

Arnaud Virazel, Luigi Dilillo, Patrick Girard, 2005 .

Advanced Solutions for Innovative SOC Testing in Europe, Contrat CEE ASSOCIATE A503, Programme MEDEA+ (Rapport Technique de Fin d'Année)

Christian Landrault, Florence Azaïs, Michel Renovell, 2002 .

TOETS CT302 - Programme CEE CATRENE - Summary Technical Report 2S-2009 - Rapport Technique de Fin d'année

Giorgio Di Natale, Arnaud Virazel, Alberto Bosio, 2010 .

Variability Analysis of an SRAM Test Chip

Arnaud Virazel, Alberto Bosio, Patrick Girard, 2011, ETS 2011.

Trade-off Between Power Dissipation and Delay Fault Coverage for LOS and LOC Testing Schemes

Xiaoqing Wen, Arnaud Virazel, Alberto Bosio, 2009 .

SRAM Core-cell Quality Metrics

Arnaud Virazel, Alberto Bosio, Luigi Dilillo, 2009 .

A Logic Diagnosis Approach for Sequential Circuits

Arnaud Virazel, Alberto Bosio, Luigi Dilillo, 2009, ETS 2009.

Test de Circuits et de Systèmes Intégrés

Christian Landrault, Florence Azaïs, Michel Renovell, 2004 .

Power Conscious Testing

Christian Landrault, Patrick Girard, Y. Bonhomme, 2003 .

Génération automatique de vecteurs de test au niveau transistor

Christian Landrault, Serge Pravossoudovitch, Marie-Lise Flottes, 1989 .

Robustness Improvement of Digital Circuits A New Hybrid Fault Tolerant Architecture

Arnaud Virazel, Alberto Bosio, Luigi Dilillo, 2012 .

Characterization of an SRAM based particle detector for mixed-field radiation environments

Aida Todri, Alberto Bosio, J. Mekki, 2013, 5th IEEE International Workshop on Advances in Sensors and Interfaces IWASI.

Radiation Induced Effects on Electronic Systems and ICs

Arnaud Virazel, Alberto Bosio, Patrick Girard, 2012 .

Conditions pour le Test de Pannes de Délai des Look-Up Table dans les FPGA à Base de SRAM

Olivier Heron, Michel Renovell, Patrick Girard, 2008 .

March Tests Improvements for Address Decoder Open and Resistive Open Fault Detection

Arnaud Virazel, Luigi Dilillo, Simone Borri, 2004 .

Diagnostic Multi-Modèles des Circuits Logiques

Arnaud Virazel, Serge Pravossoudovitch, Patrick Girard, 2006 .

Contribution au test des circuits intégrés MOS : génération automatique de vecteurs de test au niveau transistors interrupteurs

Serge Pravossoudovitch, 1987 .