Robert J. Baseman

IBM Research Report Data Analytics and Stochastic Modeling in a Semiconductor Fab

Sholom M. Weiss, Andrew J. Davenport, Sugato Bagchi, 2009 .

Virtual Metrology and Run-to-Run Control in Semiconductor Manufacturing

Yada Zhu, Jingrui He, Emmanuel Yashchin, 2012 .

Continuous prediction of manufacturing performance throughout the production lifecycle

Amit Dhurandhar, Sholom M. Weiss, Brian F. White, 2016, J. Intell. Manuf..

A Unified Framework for Outlier Detection in Trace Data Analysis

Yada Zhu, Noam Slonim, Zhiguo Li, 2014, IEEE Transactions on Semiconductor Manufacturing.

Improving quality control by early prediction of manufacturing outcomes

Amit Dhurandhar, Sholom M. Weiss, Robert J. Baseman, 2013, KDD.

Rule-based data mining for yield improvement in semiconductor manufacturing

Sholom M. Weiss, Fateh Tipu, Raminderpal Singh, 2010, Applied Intelligence.