Young-Don Ko

A neural network-based soft sensor for particle size distribution using image analysis

Young-Don Ko, Helen Shang, H. Shang, 2011 .

Functional Kernel-Based Modeling of Wavelet Compressed Optical Emission Spectral Data: Prediction of Plasma Etch Process

Young-Don Ko, Byungwhan Kim, Myong-Kee Jeong, 2010, IEEE Sensors Journal.

Exponentially weighted moving average-based procedure with adaptive thresholding for monitoring nonlinear profiles: Monitoring of plasma etch process in semiconductor manufacturing

Young-Don Ko, Young-Seon Jeong, Byungwhan Kim, 2013, Expert Syst. Appl..