A. Benhassain

Cognitive approach to support dynamic aging compensation

David Meyer, Sylvie Naudet, Vincent Huard, 2017, 2017 IEEE International Test Conference (ITC).

Digital circuits reliability with in-situ monitors in 28nm fully depleted SOI

Lorena Anghel, X. Federspiel, Vincent Huard, 2015, 2015 Design, Automation & Test in Europe Conference & Exhibition (DATE).

In-situ slack monitors: taking up the challenge of on-die monitoring of variability and reliability

Lorena Anghel, Vincent Huard, Florian Cacho, 2016, 2016 1st IEEE International Verification and Security Workshop (IVSW).