M. Zoaeter

Bias temperature instability from gate charge characteristics investigations in N-Channel Power MOSFET

M. Alwan, B. Beydoun, K. Ketata, 2007, Microelectron. J..

ANALYSIS AND SIMULATION OF FUNCTIONAL STRESS DEGRADATION ON VDMOS POWER TRANSISTORS

B. Beydoun, M. Zoaeter, M. Hajjar, 2002 .

Using the Cyclostationarity of Electrical Signal for Bearing Fault Detection in Induction Machine

M. Zoaeter, A. Ibrahim, M. El Badaoui, 2006, 2006 IEEE International Conference on Industrial Technology.

Numerical simulation and modeling of static characteristics and electrical noise in submicron MOS transistors

Gerard Ghibaudo, M. Zoaeter, J. Jomaah, 2000, ICECS 2000. 7th IEEE International Conference on Electronics, Circuits and Systems (Cat. No.00EX445).

Static and low frequency noise characterization of surface- and buried-mode 0.1 mum P and N MOSFETs

M. Zoaeter, Gérard Ghibaudo, G. Guégan, 2002, Microelectron. Reliab..

2D analysis of functional stress degradations on power VDMOS transistor

B. Beydoun, M. Zoaeter, A. Alaeddine, 2004 .

Gate charge behaviors in N-channel power VDMOSFETs during HEF and PBT stresses

M. Alwan, B. Beydoun, K. Ketata, 2007, Microelectron. Reliab..

Two-dimensional simulation of the thermal stress effect on static and dynamic VDMOS characteristics

B. Beydoun, K. Ketata, M. Zoaeter, 2005 .