Brian F. Usher

Determination Of Critical Thickness In InxGa1-xAs/GaAs Heterostructures By X-Ray Diffraction And Photoluminescence Measurements

P. C. Taylor, P. J. Orders, Brian F. Usher, 1987, Other Conferences.

Poisson's ratio of AIAs

Brian F. Usher, D. Zhou, T. Warminski, 2000, International Conference on Thin Film Physics and Applications.

Thickness and composition determination of MBE-grown strained multiple quantum well structures by x-ray diffraction

Brian F. Usher, D. Zhou, 2000, International Conference on Thin Film Physics and Applications.

90-deg Bragg reflection from a thin crystalline film

Andreas K. Freund, Tetsuya Ishikawa, Andrei Yurievich Nikulin, 2001, SPIE Optics + Photonics.

Experimental Observation of X‐Ray Diffraction from a Thin Crystalline Film at a 90° Bragg Reflection

Andreas K. Freund, John R Davis, Brian F. Usher, 2000 .

Critical thickness determination of InxGa1-xAs/GaAs strained-layer system by transmission electron microscopy

Jin Zou, Brian F. Usher, D. Cockayne, 1991 .

Formation of misfit dislocations during growth of InxGa1-xAs/GaAs strained-layer heterostructures

Adrian A. Hopgood, N St J Braithwaite, Brian F. Usher, 1999 .