Douglas Kay

Compression technique for interactive BIST application

Samiha Mourad, Douglas Kay, 2001, Proceedings 19th IEEE VLSI Test Symposium. VTS 2001.

Partial-Matching Technique in a Mixed-Mode BIST Environment

Samiha Mourad, Douglas Kay, Taweesak Reungpeerakul, 2010, IEEE Transactions on Instrumentation and Measurement.

CTL the language for describing core-based test

Rohit Kapur, Brion L. Keller, Maurice Lousberg, 2001, Proceedings International Test Conference 2001 (Cat. No.01CH37260).

Unified fault management using Logic Built-In Self-Test and logic bitmap

Douglas Kay, Matthias Kamm, Lien Tran, 2009, 2009 IEEE/SEMI Advanced Semiconductor Manufacturing Conference.

Embedded test control schemes using iBIST for SOCs

Samiha Mourad, Douglas Kay, Sung Chung, 2005, IEEE Transactions on Instrumentation and Measurement.

Embedded test control schemes for compression in SOCs

Samiha Mourad, Douglas Kay, Sung Chung, 2002, DAC '02.