Marcel A. J. van Gils

Prediction of crack growth in IC passivation layers

Willem D. van Driel, G. Q. Zhang, Leo J. Ernst, 2004, Microelectron. Reliab..

Prediction of interfacial delamination in stacked IC structures using combined experimental and simulation methods

Willem D. van Driel, G. Q. Zhang, C. J. Liu, 2004, Microelectron. Reliab..

Virtual qualification of moisture induced failures of advanced packages [IC packages]

Willem D. van Driel, G. Q. Zhang, H. J. L. Bressers, 2004, 5th International Conference on Thermal and Mechanical Simulation and Experiments in Microelectronics and Microsystems, 2004. EuroSimE 2004. Proceedings of the.