S. Cherubal

Signature Testing of Analog and RF Circuits: Algorithms and Methodology

Abhijit Chatterjee, Soumendu Bhattacharya, Sasikumar Cherubal, 2007, IEEE Transactions on Circuits and Systems I: Regular Papers.

System-level testing of RF transmitter specifications using optimized periodic bitstreams

Abhijit Chatterjee, Achintya Halder, Soumendu Bhattacharya, 2004, 22nd IEEE VLSI Test Symposium, 2004. Proceedings..

Efficient test strategy for TDMA power amplifiers using transient current measurements: uses and benefits

Abhijit Chatterjee, Soumendu Bhattacharya, Ganesh Srinivasan, 2004, Proceedings Design, Automation and Test in Europe Conference and Exhibition.

Test time reduction for ACPR measurement of wireless transceivers using periodic bit-stream sequences

Abhijit Chatterjee, Soumendu Bhattacharya, Ganesh Srinivasan, 2004, Proceedings. DELTA 2004. Second IEEE International Workshop on Electronic Design, Test and Applications.

Prediction of analog performance parameters using fast transienttesting

Abhijit Chatterjee, Pramodchandran N. Variyam, Sasikumar Cherubal, 2002, IEEE Trans. Comput. Aided Des. Integr. Circuits Syst..

An efficient hierarchical fault isolation technique for mixed-signal boards

Abhijit Chatterjee, Sasikumar Cherubal, A. Chatterjee, 2000, VLSI Design 2000. Wireless and Digital Imaging in the Millennium. Proceedings of 13th International Conference on VLSI Design.

Fault diagnosis for mixed-signal electronic systems

Abhijit Chatterjee, S. Cherubal, S. Chakrabarti, 1999, 1999 IEEE Aerospace Conference. Proceedings (Cat. No.99TH8403).

Parametric fault diagnosis for analog systems using functional mapping

Abhijit Chatterjee, Sasikumar Cherubal, A. Chatterjee, 1999, Design, Automation and Test in Europe Conference and Exhibition, 1999. Proceedings (Cat. No. PR00078).

Concurrent RF test using optimized modulated RF stimuli

Abhijit Chatterjee, John McLaughlin, Sasikumar Cherubal, 2004, 17th International Conference on VLSI Design. Proceedings..

Production deployment of a fast transient testing methodology for analog circuits: case study and results

Abhijit Chatterjee, Sasikumar Cherubal, Ramakrishna Voorakaranam, 2003, International Test Conference, 2003. Proceedings. ITC 2003..

A signature test framework for rapid production testing of RF circuits

Abhijit Chatterjee, Sasikumar Cherubal, Ramakrishna Voorakaranam, 2002, Proceedings 2002 Design, Automation and Test in Europe Conference and Exhibition.

Hierarchical specification-driven analog fault modeling for efficient fault simulation and diagnosis

R. Voorakaranam, S. Chakrabarti, J. Hou, 1997, Proceedings International Test Conference 1997.

Fast specification test of TDMA power amplifiers using transient current measurements

Abhijit Chatterjee, S. Cherubal, S. Bhattacharya, 2005 .