M. Purtell

Alternate Test Methodology for High Speed A/D Converter Testing on Low Cost Tester

Shalabh Goyal, Michael Purtell, Shalabh Goyal, 2005, 14th Asian Test Symposium (ATS'05).

A Low-Cost Test Methodology for Dynamic Specification Testing of High-Speed Data Converters

Abhijit Chatterjee, Shalabh Goyal, Michael Purtell, 2007, J. Electron. Test..

Testing for resistive opens and stuck opens

Edward J. McCluskey, Chien-Mo James Li, Chao-Wen Tseng, 2001, Proceedings International Test Conference 2001 (Cat. No.01CH37260).