Thomas D. Moore

Erratum to "A simple and fundamental design rule for resisting delamination in bimaterial structures" [Microelectronics Reliability 2003;43: 487-494]

Thomas D. Moore, John L. Jarvis, 2003, Microelectron. Reliab..

Improved reliability in small multichip ball grid arrays

Thomas D. Moore, John L. Jarvis, 2001, Microelectron. Reliab..

Thermomechanical deformation of a bimaterial plate--as applied to laminate IC assemblies

Thomas D. Moore, John L. Jarvis, 2003, Microelectron. Reliab..

A simple and fundamental design rule for resisting delamination in bimaterial structures

Thomas D. Moore, John L. Jarvis, 2003, Microelectron. Reliab..

The effects of in-plane orthotropic properties in a multi-chip ball grid array assembly

Thomas D. Moore, John L. Jarvis, 2002, Microelectron. Reliab..

Peeling in Bimaterial Beams: The Peeling Moment and Its Relation to the Differential Rigidity

Thomas D. Moore, John L. Jarvis, 2004 .