J. Wilkinson
发表
J.D. Wilkinson,
T. Brown,
B. Gerbi,
2005,
IEEE Transactions on Device and Materials Reliability.
R.A. Reed,
L.W. Massengill,
R.D. Schrimpf,
2007,
2007 IEEE International Conference on Integrated Circuit Design and Technology.
R.A. Reed,
L.W. Massengill,
R.D. Schrimpf,
2007,
IEEE Transactions on Nuclear Science.
R.A. Reed,
R.D. Schrimpf,
L.W. Massengill,
2007,
IEEE Electron Device Letters.
J. Wilkinson,
S. Hareland,
S. Hareland,
2005,
IEEE Transactions on Device and Materials Reliability.