P. H. Eaton

Effect of multiple-transistor charge collection on SET pulse widths

B. L. Bhuva, B. Narasimham, L. W. Massengill, 2010, 2010 IEEE International Reliability Physics Symposium.

Neurocontrollers for Ball-and-Beam Systems

Donald C. Wunsch, Danil V. Prokhorov, P. H. Eaton, 1996 .

SEU and SET Mitigation Techniques for FPGA Circuit and Configuration Bit Storage Design

P. H. Eaton, D. G. Mavis, 2005 .

Radiation and Reliability Concerns for Modern Nonvolatile Memory Technology

Kenneth A. LaBel, Dale McMorrow, Hak Kim, 2011 .

Effect of Multiple-Transistor Charge Collection on Single-Event Transient Pulse Widths

L. W. Massengill, B. L. Bhuva, B. Narasimham, 2011, IEEE Transactions on Device and Materials Reliability.

Single-Event Effects Induced by Through-Wafer Sub-Bandgap Two-Photon Absorption

Lloyd W. Massengill, Phillip P. Jenkins, Joseph S. Melinger, 2007 .