Michihiko Mifuji

Circuit level prediction of device performance degradation due to negative bias temperature stress

Tadahiro Ohmi, Rihito Kuroda, Akinobu Teramoto, 2007, Microelectron. Reliab..

Development of NBTI Lifetime Prediction Method and Evaluation Method using Hole Injection Technique

Tadahiro Ohmi, Rihito Kuroda, S. Sugawa, 2005 .