A. Jacobelli

发表

Active microelement testing by interferometry using time-average and quasi-stroboscopic techniques

Krzysztof Patorski, Christophe Gorecki, Michal Jozwik, 2003, SPIE Optical Metrology.

Design, testing, and calibration of an integrated Mach-Zehnder-based optical read-out architecture for MEMS characterization

Christophe Gorecki, Michal Jozwik, Thierry Dean, 2004, SPIE Photonics Europe.