H. Kunz

A flexible simulation model for system level ESD stresses with application to ESD design and troubleshooting

E. Rosenbaum, R. Mertens, H. Kunz, 2012, Electrical Overstress / Electrostatic Discharge Symposium Proceedings 2012.

Formation and suppression of a newly discovered secondary EOS event in HBM test systems

C. Duvvury, J. Schichl, T. Meuse, 2004, 2004 Electrical Overstress/Electrostatic Discharge Symposium.

HBM stress of no-connect IC pins and subsequent arc-over events that lead to human-metal-discharge-like events into unstressed neighbor pins

C. Duvvury, S. Marum, J. Schichl, 2006, 2006 Electrical Overstress/Electrostatic Discharge Symposium.

The effect of high pin-count ESD tester parasitics on transiently triggered ESD clamps

C. Duvvury, L. Ting, R. Steinhoff, 2004, 2004 Electrical Overstress/Electrostatic Discharge Symposium.