G. Boselli
发表
E. Rosenbaum,
R. Mertens,
H. Kunz,
2012,
Electrical Overstress / Electrostatic Discharge Symposium Proceedings 2012.
H. Shichijo,
N. Mahalingam,
J. Ai,
2002,
Digest. International Electron Devices Meeting,.
C. Duvvury,
V. Reddy,
G. Boselli,
2005,
2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual..
C. Duvvury,
G. Boselli,
2004,
IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004..
C. Duvvury,
L. Ting,
R. Steinhoff,
2004,
2004 Electrical Overstress/Electrostatic Discharge Symposium.
C. Duvvury,
G. Boselli,
V. Vassilev,
2007,
2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual.
G. Boselli,
A. Appaswamy,
F. Farbiz,
2013,
2013 IEEE International Reliability Physics Symposium (IRPS).
C. Duvvury,
V. Reddy,
G. Boselli,
2004,
IEEE Transactions on Device and Materials Reliability.
C. Duvvury,
J. Rodriguez,
B. Hornung,
2003,
IEEE International Electron Devices Meeting 2003.
S. Ramaswamy,
A. Amerasekera,
G. Boselli,
2001,
2001 Electrical Overstress/Electrostatic Discharge Symposium.
Akram A. Salman,
G. Boselli,
M. Dissegna,
2012,
2012 IEEE International Reliability Physics Symposium (IRPS).