Dongkyu Lee

Impact of floating gate dry etching on erase characteristics in NOR flash memory

Kang-Deog Suh, Yonghan Roh, W.H. Lee, 2002, IEEE Electron Device Letters.

Mobile ion-induced data retention failure in NOR flash memory cell

K. Suh, Keonsoo Kim, K. Ahn, 2001 .

Data retention failure in NOR flash memory cells

K. Suh, Keonsoo Kim, W. Lee, 2001, 2001 IEEE International Reliability Physics Symposium Proceedings. 39th Annual (Cat. No.00CH37167).

Influence of plasma edge damage on erase characteristics of NOR flash EEPROM using channel erase method

Kang-Deog Suh, Yonghan Roh, Woung-Moo Lee, 2002, 2002 IEEE International Reliability Physics Symposium. Proceedings. 40th Annual (Cat. No.02CH37320).