László Kotis

Unexpectedly high sputtering yield of carbon at grazing angle of incidence ion bombardment

Á. Barna, G. Radnóczi, M. Menyhárd, 2005 .

Simulation and measurement of AES depth profiles; a case study of the C/Ta/C/Si system

G. Sáfrán, M. Menyhárd, A. Jablonski, 2010 .

Ion beam mixing by focused ion beam

Á. Barna, A. Tóth, J. Lábár, 2007 .