W. Fayad

Steady-state grain-size distributions resulting from grain growth in two dimensions

C. Thompson, H. Frost, W. Fayad, 1999 .

Simulation of the effect of microstructure on electromigration induced failure of interconnects

Walid R. Fayad, W. Fayad, 1997 .

Modeling of the effects of crystallographic orientation on electromigration-limited reliability of interconnects with bamboo grain structures

C. Thompson, V. Andleigh, W. Fayad, 2001 .

Grain Structure Statistics in As-Patterned and Annealed Interconnects

C. Thompson, H. Frost, V. Andleigh, 1998 .