文
论文分享
演练场
杂货铺
论文推荐
字
编辑器下载
登录
注册
Tsai-Fu Chang
发表
Resist-related damage on ultrathin gate oxide during plasma ashing
Horng-Chih Lin, Tiao-Yuan Huang, Chun-Yen Chang, 1997, IEEE Electron Device Letters.