M. Ohlídal

发表

Optical Characterization of Non-Stoichiometric Silicon Nitride Films Exhibiting Combined Defects

I. Ohlídal, P. Vašina, D. Franta, 2019, Coatings.

Stable a-CSi:H films with a wide range of modulus of elasticity and low internal stress

M. Ohlídal, Václav Šulc, V. Čech, 2022, Surface and Coatings Technology.

IV: Scattering of Light from Multilayer Systems With Rough Boundaries

Miloslav Ohlídal, Ivan Ohlídal, Karel Navrátil, 1995 .

Determining shape of thickness non-uniformity using variable-angle spectroscopic ellipsometry

I. Ohlídal, V. Buršíková, D. Franta, 2020 .

Ellipsometric characterization of inhomogeneous thin films with complicated thickness non-uniformity: application to inhomogeneous polymer-like thin films.

I. Ohlídal, V. Buršíková, J. Vohánka, 2020, Optics express.

Ellipsometric studies of polished silicon surfaces

I. Ohlídal, F. Lukes̆, M. Ohlídal, 1976 .

Mapping of properties of thin plasma jet films using imaging spectroscopic reflectometry

M. Ohlídal, J. Benedikt, L. Zajíčková, 2014 .

Simultaneous determination of dispersion model parameters and local thickness of thin films by imaging spectrophotometry

I. Ohlídal, A. Majumdar, M. Ohlídal, 2015 .

Measurement of the thickness distribution and optical constants of non-uniform thin films

I. Ohlídal, M. Ohlídal, D. Nečas, 2011 .

Application of spectroscopic imaging reflectometry to analysis of area non-uniformity in diamond-like carbon films

I. Ohlídal, V. Buršíková, D. Nečas, 2009 .

Optical characterization of non-uniform thin films using imaging spectrophotometry

Petr Klapetek, Vladimir Cudek, Miloslav Ohlídal, 2005, SPIE Optical Systems Design.

New Method for the Complete Optical Analysis of Thin Films Nonuniform in Optical Parameters

I. Ohlídal, P. Klapetek, M. Eliás, 2003 .

Complete optical characterization of the SiO2/Si system by spectroscopic ellipsometry, spectroscopic reflectometry and atomic force microscopy

Emil Pinčík, Daniel Franta, Miloslav Ohlídal, 1999 .

Optical characterization of diamond-like carbon thin films non-uniform in thickness using spectroscopic reflectometry

I. Ohlídal, V. Buršíková, D. Nečas, 2008 .

Correlation of thermal stability of the mechanical and optical properties of diamond-like carbon films

I. Ohlídal, P. Sťahel, V. Buršíková, 2007 .

Experimental analysis of irregularities of metallic surfaces generated by abrasive waterjet

Petr Hlaváček, Jan Valíček, Sergej Hloch, 2007 .

Optical measurement of mechanical stresses in diamond-like carbon films

Miloslav Ohlidal, Petr Klapetek, Ivan Ohlidal, 2005, Other Conferences.

Influence of technological conditions on mechanical stresses inside diamond-like carbon films

I. Ohlídal, M. Ohlídal, V. Buršíková, 2005 .

Simultaneous determination of optical constants, local thickness and roughness of ZnSe thin films by imaging spectroscopic reflectometry

I. Ohlídal, D. Nečas, D. Franta, 2015 .

Optical characterization of thin films non‐uniform in thickness by a multiple‐wavelength reflectance method

Daniel Franta, Tomáš Králík, Miloslav Ohlídal, 2002 .

Imaging spectroscopic reflectometer based on pellicle beamsplitter

J. Vodák, V. Čudek, P. Nádaský, 2015, SPIE Optical Systems Design.

Optical characterization of nonabsorbing and weakly absorbing thin films with the wavelengths related to extrema in spectral reflectances.

I. Ohlídal, K. Navrátil, D. Franta, 2001, Applied optics.

Determination of thicknesses and spectral dependences of refractive indices of non-absorbing and weakly absorbing thin films using the wavelengths related to extrema in spectral reflectances

I. Ohlídal, K. Navrátil, D. Franta, 2001 .

SPECTRAL ANALYSIS OF METALLIC SURFACES TOPOGRAPHY GENERATED

S. Hloch, M. Ohlídal, 2012 .

Application of imaging spectroscopic reflectometry for characterization of gold reduction from organometallic compound by means of plasma jet technology

J. Macák, D. Pavliňák, R. Jambor, 2017 .

Optical Characterization of Thin Films by Means of Imaging Spectroscopic Reflectometry

M. Ohlídal, D. Nečas, J. Vodák, 2018 .

Possibilities and limitations of imaging spectroscopic reflectometry in optical characterization of thin films

Pavel Nádaský, Ivan Ohlidal, David Nečas, 2015, SPIE Optical Systems Design.

Assessment of non-uniform thin films using spectroscopic ellipsometry and imaging spectroscopic reflectometry

I. Ohlídal, L. Zajíčková, D. Nečas, 2014 .

Measurement of thickness distribution, optical constants, and roughness parameters of rough nonuniform ZnSe thin films.

I. Ohlídal, D. Nečas, D. Franta, 2014, Applied optics.

Optical characterisation of SiOxCyHz thin films non-uniform in thickness using spectroscopic ellipsometry, spectroscopic reflectometry and spectroscopic imaging reflectometry

I. Ohlídal, V. Buršíková, D. Nečas, 2011 .

Characterization of thin films nonuniform in optical parameters by spectroscopic digital reflectometry

Miloslav Ohlidal, Petr Klapetek, Ivan Ohlidal, 2004, SPIE Optics + Photonics.

Analysis of inhomogeneous thin films of ZrO2 by the combined optical method and atomic force microscopy

P. Pokorný, I. Ohlídal, M. Ohlídal, 2001 .

Mechanical stresses studied by optical methods in diamond-like carbon films containing Si and O

Martin Siler, Miloslav Ohlidal, Ivan Ohlidal, 2004, SPIE Optics + Photonics.

An evolutionary approach to collective communication scheduling

Jirí Jaros, Milos Ohlídal, Václav Dvorák, 2007, GECCO '07.

Performance of Collective Communications on Interconnection Networks with Fat nodes and Edges

Jirí Jaros, Milos Ohlídal, Václav Dvorák, 2006, International Conference on Networking, International Conference on Systems and International Conference on Mobile Communications and Learning Technologies (ICNICONSMCL'06).