Štěpán Šustek

Optical Characterization of Non-Stoichiometric Silicon Nitride Films Exhibiting Combined Defects

I. Ohlídal, P. Vašina, D. Franta, 2019, Coatings.

Determining shape of thickness non-uniformity using variable-angle spectroscopic ellipsometry

I. Ohlídal, V. Buršíková, D. Franta, 2020 .

Ellipsometric characterization of inhomogeneous thin films with complicated thickness non-uniformity: application to inhomogeneous polymer-like thin films.

I. Ohlídal, V. Buršíková, J. Vohánka, 2020, Optics express.