I. G. D'yachkova

X-Ray Diagnostics of Microstructure Defects of Silicon Crystals Irradiated by Hydrogen Ions

F. Chukhovskii, V. Asadchikov, D. Zolotov, 2019, Technical Physics.

X-ray Diffraction Tomography Using Laboratory Sources for Studying Single Dislocations in a Low Absorbing Silicon Single Crystal

F. Chukhovskii, V. Asadchikov, A. Buzmakov, 2019, Optoelectronics, Instrumentation and Data Processing.

X-ray Diffraction Tomography Using Laboratory Sources for Studying Single Dislocations in a Low Absorbing Silicon Single Crystal

F. Chukhovskii, V. Asadchikov, A. Buzmakov, 2019, Optoelectronics, Instrumentation and Data Processing.