J. Sites

X‐ray photoelectron spectroscopy of ion beam sputter deposited SiO2, TiO2, and Ta2O5

S. Rossnagel, J. Sites, 1984 .

Effects of oxygen content on the optical properties of tantalum oxide films deposited by ion-beam sputtering.

K. Geib, H. Demiryont, H Demiryont, 1985, Applied optics.

Summary Abstract: Ion‐beam sputter deposition of oxide films

H. Demiryont, D. Kerwin, H. Demiryont, 1985 .