A. Viard

发表

Patrick Tounsi, Alexandre Boyer, Nabil El Belghiti Alaoui, 2018, Microelectron. Reliab..

Alexandre Boyer, P. Tounsi, Nabil El Belghiti Alaoui, 2019, 2019 MIXDES - 26th International Conference "Mixed Design of Integrated Circuits and Systems".

Patrick Tounsi, Alexandre Boyer, Nabil El Belghiti Alaoui, 2019, Microelectronics Reliability.