A. Viard
发表
Patrick Tounsi,
Alexandre Boyer,
Nabil El Belghiti Alaoui,
2018,
Microelectron. Reliab..
Alexandre Boyer,
P. Tounsi,
Nabil El Belghiti Alaoui,
2019,
2019 MIXDES - 26th International Conference "Mixed Design of Integrated Circuits and Systems".
Patrick Tounsi,
Alexandre Boyer,
Nabil El Belghiti Alaoui,
2019,
Microelectronics Reliability.