A. Gardner

Al doped Ba hexaferrite (BaAlxFe12-xO19) thin films on Pt using metallo-organic decomposition

Z. Celinski, Y. Nie, I. Harward, 2012 .

Observation of Configurational Switching of Deep Defects in a-Si:H Using Thermal Step Insertion During Capacitance Transient Measurements

J. D. Cohen, A. Gardner, 1996 .

New evidence for deep defect relaxation in hydrogenated amorphous silicon from junction capacitance methods

D. Kwon, J. D. Cohen, A. Gardner, 1996 .